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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12119362 B1

PDFFull Text
Date of Patent:
Oct. 15, 2024

Filed:

Feb. 25, 2021

Light sensor including long-pass filter and light detection system

Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventors:

Sanshiro Shishido, Osaka, JP;

Shinichi Machida, Osaka, JP;

Takeyoshi Tokuhara, Osaka, JP;

Katsuya Nozawa, Osaka, JP;

Assignee:

PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD., Osaka, JP;

Attorney:

Rimon P.C.

Primary Examiner:

Ida M Soward

Int. Cl.
CPC ...
H01L 27/14 (2006.01); G02B 5/20 (2006.01); H01L 27/146 (2006.01); H01L 31/0352 (2006.01); H01L 31/0384 (2006.01); H01L 27/142 (2014.01); H01L 31/0256 (2006.01);
U.S. Cl.
CPC ...
H01L 27/14625 (2013.01); G02B 5/208 (2013.01); H01L 27/14621 (2013.01); H01L 27/14627 (2013.01); H01L 27/14667 (2013.01); H01L 31/035218 (2013.01); H01L 31/035227 (2013.01); H01L 31/03845 (2013.01); H01L 27/142 (2013.01); H01L 27/14643 (2013.01); H01L 2031/0344 (2013.01);
Abstract

A light sensor includes a photoelectric conversion layer and a long-pass filter that is disposed above the photoelectric conversion layer. The photoelectric conversion layer has a spectral sensitivity characteristic having a first peak at a first wavelength that is longer than a cut-on wavelength of the long-pass filter, and a spectral sensitivity of the photoelectric conversion layer at the cut-on wavelength is greater than or equal to 0% and less than or equal to 50% of a spectral sensitivity of the photoelectric conversion layer at the first wavelength.

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