The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2024

Filed:

Jun. 04, 2024
Applicants:

Capital Normal University, Beijing, CN;

China University of Mining and Technology, Beijing, CN;

Inventors:

Hui Ding, Beijing, CN;

Guoping Huo, Beijing, CN;

Jiacheng Lu, Beijing, CN;

Yuhan Huang, Beijing, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 19/20 (2011.01); G06V 10/774 (2022.01);
U.S. Cl.
CPC ...
G06T 19/20 (2013.01); G06T 2200/04 (2013.01); G06T 2219/2016 (2013.01); G06V 10/774 (2022.01);
Abstract

A method and an apparatus for augmenting data of a three-dimensional image, an electronic device and a storage medium are provided. The method includes acquiring at least one three-dimensional sample image to be augmented; rotating, for each three-dimensional sample image, the three-dimensional sample image according to a predetermined rotation angle to obtain an initial sample image of a radial slice of the three-dimensional sample image on a transverse section, an initial sample image of the radial slice of the three-dimensional sample image on a median sagittal section and an initial sample image of the radial slice of the three-dimensional sample image on a coronal section; performing interpolation processing on a plurality of initial sample images to obtain a plurality of augmented sample images; and adding the plurality of augmented sample images into corresponding datasets to obtain an augmented three-dimensional sample image set.


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