The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2024
Filed:
May. 17, 2021
Two Six Labs, Llc, Arlington, VA (US);
James Gentile, Arlington, VA (US);
Chae A. Clark, Arlington, VA (US);
Ben Gelman, Arlington, VA (US);
Two Six Labs, LLC, Arlington, VA (US);
Abstract
A machine learning approach for evaluating the replicability of research receives a scholarly paper or publication about a research effort, and applies learning models and natural language processing (NLP) to identify replicability of the asserted results. Rule based and machine learning approaches employ models based on preexisting research papers having defined replicability, and compares language features, research parameters and factual assertions extracted from a research paper for evaluation. A pipeline of evaluations and feature extraction analyzes the content of the research paper and renders a prediction value that the described research can be repeated with similar results.