The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2024

Filed:

Aug. 25, 2022
Applicant:

Capital One Services, Llc, McLean, VA (US);

Inventors:

Phanindra Rao, Celina, TX (US);

Peter Gaspare Terrana, Mechanicsville, VA (US);

Vannia Gonzalez Macias, Glen Allen, VA (US);

Assignee:

Capital One Services, LLC, McLean, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01); G06F 9/54 (2006.01); G06F 21/55 (2013.01); H04L 29/06 (2006.01);
U.S. Cl.
CPC ...
G06F 21/554 (2013.01); G06F 2221/034 (2013.01);
Abstract

Methods and systems are described herein for determining auxiliary parameters within datasets, the auxiliary parameters being used to segregate the datasets such that anomaly detection may be performed on the segregated datasets. Based on anomaly detection, alert conditions may then be identified. In particular, a system may, using a machine learning model, determine for a particular target feature (e.g., a parameter being monitored) one or more auxiliary features (other parameters) that effect the values of that parameter and transmit the target feature and the auxiliary features in a message to a monitoring system indicating which features to monitor. The collected data may then be received by the system and transformed into a timeseries dataset, which may then be used to detect anomalies within the data and thereby identify any anomalous points.


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