The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2024

Filed:

Apr. 05, 2023
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Nazmiye Ceren Abay, Bothell, WA (US);

Nikolay Sergeyevich Rovinskiy, Redmond, WA (US);

Dhawal Dilip Parkar, Bellevue, WA (US);

Vijaykumar Kuberappa Aski, Bellevue, WA (US);

Neil Tenenholtz, Cambridge, MA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3075 (2013.01); G06F 11/3447 (2013.01);
Abstract

The disclosed techniques pertain to the dynamic control of select functions that are applied to a time series dataset based on the detection of stationary time series grains. In some configurations, a system selectively applies select functions, e.g., the application of a differencing function, to a dataset in response to determining that a number of stationary time series grains detected in the dataset meets one or more criteria with respect to a threshold. If a system determines that the number of stationary time series grains meets one or more criteria with respect to a threshold, the system can apply a differencing function to the entire dataset. By controlling the differencing function based on the detection of stationary time series grains with respect to a threshold, the system can increase the accuracy and the efficiency of a machine learning system or any other system that utilizes time series datasets.


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