The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2024
Filed:
Oct. 08, 2021
Pratt & Whitney Canada Corp., Longueuil, CA;
Changsheng Guo, South Windsor, CT (US);
Clément Drouin Laberge, Terrebonne, CA;
Daniel Hayek, Pickering, CA;
Samuel S. Yang, West Hartford, CT (US);
Maxime Lebrun, Saint-Hubert, CA;
Pratt & Whitney Canada Corp., Longueuil, CA;
Abstract
A method for inspecting components includes providing a plurality of different three-dimensional component CAD models with each three-dimensional component CAD model of the plurality of different three-dimensional component CAD models sharing at least one common geometric feature. The method further includes generating an inspection sequence for the at least one common geometric feature, collecting feature manufacturing data for the at least one common geometric feature during manufacturing of a plurality of different components corresponding to the respective plurality of different three-dimensional component CAD models, analyzing the feature manufacturing data associated with the at least one common geometric feature, modifying the inspection sequence for the at least one common geometric feature based on the analyzed feature manufacturing data, and inspecting components based on the modified inspection sequence.