The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2024

Filed:

Jul. 29, 2022
Applicant:

The Trustees of the University of Pennsylvania, Philadelphia, PA (US);

Inventors:

Valerie J. Yoshioka, Philadelphia, PA (US);

Jian Lu, Wynnewood, PA (US);

Zichen Tang, Philadelphia, PA (US);

Jicheng Jin, Philadelphia, PA (US);

Roy H. Olsson, III, Philadelphia, PA (US);

Bo Zhen, Merion Station, PA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/355 (2006.01); G02F 1/35 (2006.01);
U.S. Cl.
CPC ...
G02F 1/3556 (2013.01); G02F 1/353 (2013.01);
Abstract

Nonlinear on-chip optical devices using AlScN are described herein. In one aspect, an optical component having nonlinear characteristics can include a first substrate defining a refractive index; and a nonlinear layer, the nonlinear layer disposed on the first substrate, the nonlinear layer comprising an amount of scandium (Sc), and the nonlinear layer defining a refractive index that is higher than the refractive index of the first substrate.


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Yoshioka, Valerie. (2024). Nonlinear on-chip optical devices using alscn (U.S. Patent No. 12117713). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12117713

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