The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2024
Filed:
Aug. 18, 2022
Tecat Technologies (Suzhou) Limited, Suzhou, CN;
Choon Leong Lou, Suzhou, CN;
teCat Technologies (Suzhou) Limited, Suzhou, CN;
Abstract
A test device for testing an object under test is provided. The test device includes a plurality of probe assemblies, a lower substrate, an upper substrate, a plurality of spacers, and a plurality of shielding structures. The lower substrate is used for being coupled to first contact ends of the plurality of probe assemblies. The upper substrate has a plurality of through holes. Second contact ends of the plurality of probe assemblies protrude from the upper substrate through these through holes, so as to be electrically connected to the object under test. The plurality of shielding structures is disposed between the lower substrate and the upper substrate. The plurality of shielding structures is resilient. The upper substrate, the lower substrate and the shielding structure define a plurality of accommodating regions, and each accommodating region is used for accommodating at least one of the probe assemblies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile