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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12117444 B1

PDFFull Text
Date of Patent:
Oct. 15, 2024

Filed:

Aug. 30, 2019

Enhancing agent for detection of analyte in specimen, and method for detecting analyte in specimen

Applicant:

Asahi Kasei Kabushiki Kaisha, Tokyo, JP;

Inventors:

Kotaro Oda, Tokyo, JP;

Katsuyoshi Takahashi, Tokyo, JP;

Mika Sugata, Tokyo, JP;

I-Nung Huang, Tokyo, JP;

Kazuhiko Arakawa, Tokyo, JP;

Yuichiro Takahashi, Tokyo, JP;

Assignee:

ASAHI KASEI KABUSHIKI KAISHA, Tokyo, JP;

Attorney:

Birch, Stewart, Kolasch & Birch, LLP

Primary Examiner:

Shafiqul Haq

Assistant Examiner:

Nam P Nguyen

Int. Cl.
CPC ...
G01N 33/553 (2006.01); C07C 229/12 (2006.01); C12N 1/06 (2006.01); G01N 33/543 (2006.01); G01N 33/547 (2006.01); G01N 33/558 (2006.01); G01N 33/58 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54391 (2021.08); C07C 229/12 (2013.01); C12N 1/06 (2013.01); G01N 33/54388 (2021.08); G01N 33/547 (2013.01); G01N 33/553 (2013.01); G01N 33/58 (2013.01); G01N 2458/00 (2013.01);
Abstract

Detection rapidly and with high detection intensity is accomplished while blackening is inhibited during silver enhancement to detect an analyte in a specimen. One embodiment of the present invention provides an enhancing agent to be used for silver enhancement in detection of an analyte in a specimen by metal labeling and silver enhancement, the enhancing agent including: (wherein:

Find Patent Forward Citations

Oda, Kotaro. (2024). Enhancing agent for detection of analyte in specimen, and method for detecting analyte in specimen (U.S. Patent No. 12117444). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12117444

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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