The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2024

Filed:

Mar. 15, 2024
Applicant:

Shenzhen University, Guangdong, CN;

Inventors:

Hongzhi Cui, Guangdong, CN;

Xiangpeng Cao, Guangdong, CN;

Lele Cao, Guangdong, CN;

Haibin Yang, Guangdong, CN;

Feng Yu, Guangdong, CN;

Assignee:

Shenzhen University, Guangdong, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 25/02 (2006.01);
U.S. Cl.
CPC ...
G01N 25/02 (2013.01);
Abstract

A durability test method a phase change material includes: placing a material to be tested in a solid-liquid combination test component for detecting the material to be tested, and executing a preset centrifugal rotation detection control scheme; performing cycling control on a temperature regulation semiconductor provided on the solid-liquid combination test component according to a preset temperature single-cycle regulation scheme; obtaining a temperature detection information of the material to be tested; and analyzing and processing the temperature detection information of the material to be tested to generate a durability information of the material to be tested according to a preset durability analysis method of the material to be tested.


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