The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2024

Filed:

Jul. 14, 2022
Applicants:

Tyco Electronics (Shanghai) Co. Ltd., Shanghai, CN;

Te Connectivity Services Gmbh, Schaffhausen, CH;

Inventors:

Lei (Alex) Zhou, Shanghai, CN;

Dandan (Emily) Zhang, Shanghai, CN;

Roberto Francisco-Yi Lu, Bellevue, WA (US);

Rong Zhang, Shanghai, CN;

Qing (Carrie) Zhou, Shanghai, CN;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/95 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01N 21/95 (2013.01); G01N 21/8806 (2013.01); G01N 2021/8841 (2013.01); G01N 2021/9511 (2013.01);
Abstract

A product inspection system includes an image acquisition system having a camera generating an inspection image of a product arranged between a plurality of mirrors. The inspection image has a plurality of sub images of different sides of the product. The inspection system has a calibration member with a plurality of correction patterns on different sides; the camera receives light from the calibration member reflected by the mirrors to generate a calibration image of the calibration member. A computer of the product inspection system receives the inspection image and the calibration image and determines a relative mirror position relationship between the mirrors. The computer forms a single spliced image of the product.


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