The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2024

Filed:

Mar. 30, 2022
Applicant:

Tencent Technology (Shenzhen) Company Limited, Shenzhen, CN;

Inventors:

Cheng Zhou, Shenzhen, CN;

Zhengyou Zhang, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 25/00 (2006.01); G01L 1/14 (2006.01); G01L 5/22 (2006.01); G01L 25/00 (2006.01);
U.S. Cl.
CPC ...
G01L 25/00 (2013.01); G01L 1/146 (2013.01); G01L 5/226 (2013.01);
Abstract

Embodiments of this application provide a sensor calibration method, apparatus, and device, a data measurement method, apparatus, and device, and a storage medium, where the sensor calibration method includes: acquiring a gravity of a sensor itself and a static force measured in a case that the sensor is in a static state and has no external acting force; performing equivalent calibration processing on the gravity and the static force to obtain a calibrated static force; acquiring a dynamic force measured in a case that the sensor is in a motion state and has no external acting force; performing zero drift processing on the dynamic force according to the calibrated static force to obtain a calibrated dynamic force; and using the calibrated dynamic force as a calibration parameter for performing calibration in a case that the sensor measures an external acting force, to obtain a calibrated sensor with the calibration parameter.


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