The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2024

Filed:

Feb. 04, 2021
Applicant:

Panasonic Holdings Corporation, Osaka, JP;

Inventors:

Haruhisa Yagi, Osaka, JP;

Ryuta Abe, Osaka, JP;

Tatsuya Masada, Hyogo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01); H01M 10/04 (2006.01); H01M 50/46 (2021.01);
U.S. Cl.
CPC ...
G01B 11/002 (2013.01); H01M 10/0404 (2013.01); H01M 10/0413 (2013.01); H01M 50/461 (2021.01); H01M 2220/20 (2013.01);
Abstract

An inspection device is a device that inspects the position of an electrode plate in a multilayer body, which is obtained by bonding a separator and the electrode plate to each other by means of an adhesive, from the separator side. This inspection device is provided with: an infrared light irradiation unit that irradiates the multilayer body, from the separator side, with infrared light that has a peak wavelength within the range of from 6.5 μm to 9.6 μm; a camera that takes an image of the infrared light that transmits through the separator and is reflected by the electrode plate; and a detection unit that detects the position of the electrode plate.


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