The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2024

Filed:

Apr. 17, 2020
Applicant:

Dentsply Sirona Inc., York, PA (US);

Inventors:

Susanne Maur, Bensheim, DE;

Stefan Wundrak, Bensheim, DE;

Assignee:

DENTSPLY SIRONA INC., York, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/58 (2024.01); A61B 6/00 (2024.01); A61B 6/03 (2006.01); A61B 6/40 (2024.01); A61B 6/51 (2024.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/583 (2013.01); A61B 6/032 (2013.01); A61B 6/4085 (2013.01); A61B 6/51 (2024.01); A61B 6/5205 (2013.01); A61B 6/5258 (2013.01); G06T 11/005 (2013.01); G06T 2210/41 (2013.01);
Abstract

A method of x-ray projection geometry calibration in x-ray cone beam computed tomography, including: at least one step (S) of obtaining two-dimensional x-ray images or a sinogram of at least a part of an object, generated through relatively rotating around the object a detector and an x-ray source projecting x-rays towards the detector; further including: at least one step (S) of detecting in the two dimensional x-ray images or the sinogram at least one feature of the object by using a trained artificial intelligence algorithm; and at least one step of creating, based on the detection, calibration information which defines the geometry of the x-ray projection.


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