The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2024

Filed:

Sep. 05, 2023
Applicant:

Grundium Oy, Tampere, FI;

Inventors:

Matti Pellikka, Lempäälä, FI;

Kimmo Alanen, Metsäkansa, FI;

Assignee:

Grundium Oy, Tampere, FI;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/262 (2006.01); H04N 23/80 (2023.01);
U.S. Cl.
CPC ...
H04N 5/2624 (2013.01); H04N 23/80 (2023.01);
Abstract

According to an aspect, there is provided an apparatus for performing the following. The apparatus obtains, periodically or regularly during imaging of an imaging target, images of different areas of the imaging target. At least some of the images overlap partially with each other. In response to detecting that an image and all images partially overlapping with said image have been obtained, the apparatus marks the image as completed. In response to detecting that a pre-defined number of images are marked as completed but not locked, the apparatus executes a partial image stitching process comprising: performing image stitching on non-locked images based on at least some obtained this far, locking stitched completed images and performing one or more actions. The one or more actions comprising outputting image information via at least one interface and/or storing the image information to a database accessible by a user and/or analysis device.


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