The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2024
Filed:
Apr. 10, 2023
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventors:
Hidekazu Nakashio, Saitama, JP;
Yukihiro Shindo, Chiba, JP;
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00034 (2013.01); H04N 1/00023 (2013.01); H04N 1/00074 (2013.01);
Abstract
The present invention is directed to an information processing apparatus, the method comprising: detecting whether a sheet is set in a measurement device in accordance with a detection condition; in a case where a sheet is detected as being set, measuring a patch formed on the sheet, using the measurement device; and setting a first detection condition for detecting that a sheet is set in the measurement device and a second detection condition for detecting that a sheet is not set in the measurement device to mutually-different conditions.