The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2024

Filed:

Mar. 19, 2020
Applicant:

Soitec, Bernin, FR;

Inventors:

Sylvain Ballandras, Besançon, FR;

Thierry LaRoche, Besançon, FR;

Julien Garcia, Besançon, FR;

Assignee:

Soitec, Bernin, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03H 9/64 (2006.01); G01K 11/26 (2006.01); G01S 13/75 (2006.01); G06K 7/00 (2006.01); G06K 19/067 (2006.01);
U.S. Cl.
CPC ...
H03H 9/642 (2013.01); G01K 11/265 (2013.01); G01S 13/755 (2013.01); G06K 7/00 (2013.01); G06K 19/0675 (2013.01);
Abstract

A method of interrogating an acoustic wave sensor comprises transmitting, by an interrogator, an interrogation radiofrequency signal to the acoustic wave sensor by way of a transmission antenna, receiving, by the interrogator, a response radiofrequency signal from the acoustic wave sensor by way of a reception antenna, and processing by a processing means of the interrogator the received response radiofrequency signal to obtain in-phase and quadrature components both in the time domain and the frequency domain, determining by the processing means perturbations of the obtained in-phase and quadrature components both in the time domain and the frequency domain and determining by the processing means a value of a measurand based on the detected perturbations.


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