The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2024

Filed:

Jun. 18, 2020
Applicant:

Viasat, Inc., Carlsbad, CA (US);

Inventor:

Martin Gimersky, Morges, CH;

Assignee:

Viasat, Inc., Carlsbad, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01P 1/165 (2006.01); H01P 1/16 (2006.01); H01P 1/17 (2006.01); H01P 3/00 (2006.01); H01P 3/12 (2006.01); H01Q 13/02 (2006.01); H01Q 15/24 (2006.01);
U.S. Cl.
CPC ...
H01P 1/173 (2013.01); H01P 1/16 (2013.01); H01P 1/165 (2013.01); H01P 3/12 (2013.01); H01Q 13/025 (2013.01); H01Q 15/242 (2013.01);
Abstract

Methods, systems, and devices are described for improving a performance of a waveguide device. A waveguide device that includes a common port and divided ports may also include a sidewall feature that extends across a first set of opposing sidewalls and a second set of opposing sidewalls of the waveguide device. The sidewall feature may have a same shape on each of the first set of opposing sidewalls and a second set of opposing sidewalls. In some cases, the sidewall feature is positioned outside a divided waveguide section of the waveguide device. The position of the sidewall feature may be determined based on an impedance matching metric between the common port and the divided ports, an isolation metric between the divided ports, or both.


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