The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2024

Filed:

Jun. 11, 2019
Applicant:

Covestro Intellectual Property Gmbh & Co. KG, Leverkusen, DE;

Inventors:

Giuseppe Tabbi, Düsseldorf, DE;

Christian Windeck, Viersen, DE;

Karin Clauberg, Solingen, DE;

Michael Loof, Leverkusen, DE;

Roger Scholz, Selfkant-Süsterseel, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G16C 20/30 (2019.01); G16C 20/70 (2019.01); G16C 20/90 (2019.01); G16C 60/00 (2019.01);
U.S. Cl.
CPC ...
G16C 20/30 (2019.02); G16C 20/70 (2019.02); G16C 20/90 (2019.02); G16C 60/00 (2019.02);
Abstract

The invention relates to a method for determining polymeric product properties (), wherein a prediction model () is provided for calculating polymeric product properties () based on production parameters on a computer system, which production parameters comprise formulation portions () specifying raw material portions for polymeric production and comprise processing parameters () specifying process properties during polymeric production, wherein user input is provided to the computer system, which user input comprises user production parameters () specifying a set of production parameters, user product parameters () specifying polymeric product properties and a proximity metric for quantifying conformity with the user product parameters (), wherein the computer system applies the user production parameters () to the prediction model () to calculate resultant product properties (), wherein the computer system applies the proximity metric to the resultant product properties () with respect to the user product parameters () to determine at least one proximity value indicating a match between the user product parameters () and the resultant product properties (). The invention also relates to a corresponding computer system for determining polymeric product properties.


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