The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2024

Filed:

Apr. 14, 2021
Applicants:

Hyundai Motor Company, Seoul, KR;

Kia Corporation, Seoul, KR;

Inventors:

Min Woo Kang, Incheon, KR;

Soon Woo Kwon, Ansan-si, KR;

Chung An Lee, Hwaseong-si, KR;

Hyun Ki Kim, Suwon-si, KR;

Seung Hyun Hong, Seoul, KR;

Jun Yun Kang, Changwon-si, KR;

Assignees:

HYUNDAI MOTOR COMPANY, Seoul, KR;

KIA CORPORATION, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/82 (2022.01); G06F 18/2132 (2023.01); G06F 18/24 (2023.01); G06N 3/044 (2023.01); G06N 3/045 (2023.01); G06N 3/048 (2023.01); G06N 3/08 (2023.01); G06N 3/082 (2023.01); G06N 20/00 (2019.01); G06T 3/60 (2024.01); G06T 7/00 (2017.01); G06T 7/11 (2017.01); G06V 20/70 (2022.01);
U.S. Cl.
CPC ...
G06V 10/82 (2022.01); G06F 18/2132 (2023.01); G06F 18/24 (2023.01); G06N 3/044 (2023.01); G06N 3/045 (2023.01); G06N 3/08 (2013.01); G06N 3/082 (2013.01); G06T 3/60 (2013.01); G06T 7/0002 (2013.01); G06T 7/0004 (2013.01); G06T 7/11 (2017.01); G06V 20/70 (2022.01); G06N 3/048 (2023.01); G06N 20/00 (2019.01); G06T 2207/10056 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30136 (2013.01); G06T 2207/30168 (2013.01);
Abstract

An apparatus and a method for segmenting a steel microstructure phase are provided. The apparatus includes a storage configured for storing a machine learning algorithm and a processing device that segments a microstructure phase using the machine learning algorithm. The processing device is configured to receive label data, to learn a machine learning model by use of the label data as learning data for the machine learning model, and to segment a phase of a steel microstructure image by use of the learned machine learning model.


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