The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2024

Filed:

Oct. 28, 2021
Applicant:

Argo Ai, Llc, Pittsburgh, PA (US);

Inventor:

Michel Laverne, Pittsburgh, PA (US);

Assignee:

Argo AI, LLC, Pittsburgh, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/80 (2017.01); B60W 50/14 (2020.01); B60W 60/00 (2020.01); G01S 7/497 (2006.01); H04N 17/00 (2006.01); H04N 23/695 (2023.01);
U.S. Cl.
CPC ...
G06T 7/80 (2017.01); B60W 50/14 (2013.01); B60W 60/001 (2020.02); G01S 7/497 (2013.01); H04N 17/002 (2013.01); H04N 23/695 (2023.01); B60W 2050/146 (2013.01); B60W 2420/403 (2013.01); B60W 2420/408 (2024.01); G06T 2207/10028 (2013.01); G06T 2207/30244 (2013.01); G06T 2207/30252 (2013.01);
Abstract

Methods, systems, and products for parallax estimation for sensors for autonomous vehicles may include generating a two-dimensional grid based on a field of view of a first sensor. For each respective point in the grid, a three-dimensional position of an intersection point between a first ray from the first sensor and a second ray from a second sensor may be determined. For each respective intersection point, a respective solid angle may be determined based on a first three-dimensional vector from the first sensor and a second three-dimensional vector from the second sensor to the intersection point. A matrix may be generated based on a distance from the first sensor, a distance from the second sensor, and the solid angle for each respective intersection point. At least one metric may be extracted from the matrix. An arrangement of the first and second sensors may be adjusted based on the metric(s).


Find Patent Forward Citations

Loading…