The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2024
Filed:
Jun. 22, 2021
Deere & Company, Moline, IL (US);
Zhiqiang Yuan, San Jose, CA (US);
Jie Yang, Sunnyvale, CA (US);
Deere & Company, Moline, IL (US);
Abstract
Implementations are described herein for localizing individual plants using high-elevation images at multiple different resolutions. A first set of high-elevation images that capture the plurality of plants at a first resolution may be analyzed to classify a set of pixels as invariant anchor points. High-elevation images of the first set may be aligned with each other based on the invariant anchor points that are common among at least some of the first set of high-elevation images. A mapping may be generated between pixels of the aligned high-elevation images of the first set and spatially-corresponding pixels of a second set of higher-resolution high-elevation images. Based at least in part on the mapping, individual plant(s) of the plurality of plants may be localized within one or more of the second set of high-elevation images for performance of one or more agricultural tasks.