The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2024
Filed:
Jan. 29, 2021
Applicant:
Electronics and Telecommunications Research Institute, Daejeon, KR;
Inventors:
Hye-Jin Kim, Daejeon, KR;
Suyoung Chi, Daejeon, KR;
Assignee:
Electronics and Telecommunications Research Institute, Daejeon, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06N 20/00 (2019.01); G06T 7/00 (2017.01); G06T 7/50 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0006 (2013.01); G06N 20/00 (2019.01); G06T 7/50 (2017.01); G06T 2207/20081 (2013.01); G06T 2207/30108 (2013.01);
Abstract
An apparatus for detecting a dimension error obtains an image of a target object, estimates dimensional data for a region of interest (ROI) for which dimensions are to be measured from the image of the target object using a learned dimensional measurement model, and determines whether there is a dimension error in the ROI from the estimated dimension data using a learned dimension error determination model.