The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2024
Filed:
Mar. 22, 2022
Imagination Technologies Limited, Kings Langley, GB;
Peter Smith-Lacey, Hertfordshire, GB;
Rostam King, Hertfordshire, GB;
Gregory Clark, Hertfordshire, GB;
Simon Fenney, Hertfordshire, GB;
Imagination Technologies Limited, Kings Langley, GB;
Abstract
A method and an intersection testing module in a ray tracing system for performing intersection testing for a ray with respect to a plurality of convex polygons, each of which is defined by an ordered set of vertices. The vertices of the convex polygons are projected onto a pair of axes orthogonal to the ray direction. For each edge of a convex polygon defined by two of the projected vertices, a signed parameter is determined, wherein the sign of the signed parameter is indicative of which side of the edge the ray passes on. If the ray is determined to intersect a point on the edge then the sign of the signed parameter is determined using a module which is configured to: take as inputs, indications which classify each of p, q, pand qcoordinates as negative, zero or positive, and output, for valid combinations of classifications of the p, q, pand qcoordinates, an indication of the sign of the signed parameter. It is then determined whether the ray intersects the convex polygon based on the signs of the signed parameters determined for the edges of the convex polygon.