The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2024
Filed:
Feb. 11, 2022
Devrev, Inc., Palo Alto, CA (US);
Dheeraj Pandey, San Jose, CA (US);
Manoj Agarwal, Palo Alto, CA (US);
Brent Chun, Rancho Palos Verdes, CA (US);
Bhavana Thudi, Fremont, CA (US);
Ken Chen, San Francisco, CA (US);
Nimar Arora, Union City, CA (US);
Brian Byrne, Issaquah, WA (US);
Steven Poitras, Los Gatos, CA (US);
Anindya Misra, Arlington, VA (US);
Jan Olderdissen, Herrenberg, DE;
DevRev, Inc, Palo Alto, CA (US);
Abstract
Disclosed is an improved approach to process data and events from disparate ecosystems pertaining to products. An approach is provided to automatically cluster events from various ecosystems into noteworthy incidents and to correlate them with entities extracted from each system. Incidents are correlated between ecosystems to classify the type of incidents and to give a coherent converged picture of the event streams coming from the various ecosystems. Noteworthy incidents are automatically converted into tickets and their severity is ascertained from the associated incidents. Tickets that reference underlying defects with the product or service are converted into issues.