The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2024

Filed:

May. 26, 2023
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Takahiro Suzuki, Chiba, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 15/02 (2006.01); G03G 15/00 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06K 15/027 (2013.01); G03G 15/55 (2013.01); G06T 7/001 (2013.01); G06T 2207/10008 (2013.01); G06T 2207/30144 (2013.01);
Abstract

An image-forming system includes an image-forming apparatus; a reading apparatus configured to read an image formed on a sheet to obtain read image data; and at least one processor configured to: control the image-forming apparatus to form a test chart on a first sheet, calibrate, using first read image data obtained by reading the test chart on the first sheet, second read image data that is obtained by reading an inspection target image formed by the image-forming apparatus on a second sheet based on RIP data, and inspect the inspection target image based on the calibrated second read image data and the RIP data. The test chart includes a patch arrangement with a plurality of patches, and a size of a periphery patch is smaller than a size of an interior patch.


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