The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2024

Filed:

Apr. 09, 2021
Applicant:

Hewlett Packard Enterprise Development Lp, Houston, TX (US);

Inventor:

David Strenski, Ypsilanti, MI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/50 (2006.01);
U.S. Cl.
CPC ...
G06F 9/505 (2013.01); G06F 9/5044 (2013.01); G06F 9/5072 (2013.01); G06F 9/5083 (2013.01);
Abstract

Examples disclosed herein relate to selection of a set of nodes in a HPC system for running one or more computational jobs. In some examples, the selection of the set of nodes includes gathering information about a cluster of nodes in a high-performance computing system. The HPC system may be in a production state with one or more computational workloads getting executed thereon. In some examples, periodically sending one or more test-computing jobs for execution on each node to measure one or more performance metrics thereof. Receiving measured performance metrics from each node, in response to the one or more test-computing jobs executed thereon. Recording in a database, the measured performance metrics received from each node. Selecting the set of nodes from the cluster of nodes, based on the database, and based on a request received to nm one or more computational jobs on the HPC system.


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