The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2024
Filed:
Jun. 10, 2021
Deere & Company, Moline, IL (US);
Zhiqiang Yuan, San Jose, CA (US);
DEERE & COMPANY, Moline, IL (US);
Abstract
Implementations are described herein for localizing individual plants by aligning high-elevation images using invariant anchor points while disregarding variant feature points, such as deformable plants. High-elevation images that capture the plurality of plants at a resolution at which wind-triggered deformation of individual plants is perceptible between the high-elevation images may be obtained. First regions of the high-elevation images that depict the plurality of plants may be classified as variant features that are unusable as invariant anchor points. Second regions of the high-elevation images that are disjoint from the first set of regions may be classified as invariant anchor points. The high-elevation images may be aligned based on invariant anchor point(s) that are common among at least some of the high-elevation images. Based on the aligned high-elevation images, individual plant(s) may be localized within one of the high-elevation images for performance of one or more agricultural tasks.