The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2024
Filed:
Jan. 30, 2023
Cerner Innovation, Inc., Kansas City, MO (US);
Wasimakram Binnal, Bengaluru, IN;
Karthik Kolar Nagaraja, Bengaluru, IN;
Pradeep Revanna Premakumar, Bengaluru, IN;
Cerner Innovation, Inc., Kansas City, MO (US);
Abstract
Techniques are provided for determining a delay in a data process flow at an enterprise data warehouse. An example method includes a device receiving historical data from a staging area and a target database of a data warehouse. The device can generate a feature for a machine learning model based at least in part on the historical data. The device can generate a forecasted time interval between receipt of data at the staging area and receipt of the data at the target database using the machine learning model and based at least in part on the generated feature, the data to be transmitted from the staging area to the target database. The device can compare the forecasted time interval with an expected time interval. The device can generate a work ticket based at least in part on the comparison.