The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2024

Filed:

Jan. 31, 2022
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Anna Tatunashvili, Bratislava, SK;

Rupam Bhattacharjee, Karimganj, IN;

Siba Prasad Satapathy, Bangalore, IN;

George Thayyil Jacob Sushil, Bangalore, IN;

Jozef Fekia{hacek over (c)}, Dublin, IE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3692 (2013.01); G06F 11/3414 (2013.01); G06F 11/3684 (2013.01); G06F 11/3688 (2013.01);
Abstract

In an approach to improve the extraction of test datasets for testing and resource optimization, embodiments execute a test run on a full dataset of a job, and identify existing bottlenecks in the job through a run-time monitoring interface. Additionally, embodiments execute a run-time metrics analysis, a source code analysis, and a source data impact analysis of a distributed data processing engine executing a distributed data processing job, and generate, by an analysis and impact scoring engine, an impact scoring table of job transformations based on the source code analysis. Furthermore, embodiments generate data extraction rules based on the impact scoring table, and extract a test dataset based on the data extraction rules. Moreover, embodiments evaluate the data extraction rules against user defined thresholds, and prepare a representative test dataset, and output, through a user interface on a computing device, the representative test dataset to a user.


Find Patent Forward Citations

Tatunashvili, Anna. (2024). Generating test data for application performance (U.S. Patent No. 12111755). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12111755

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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