The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2024

Filed:

Dec. 28, 2022
Applicant:

Richtek Technology Corporation, Hsinchu, TW;

Inventors:

Yu-Hsin Lih, Hsinchu, TW;

Ming-Jun Hsiao, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 35/00 (2006.01);
U.S. Cl.
CPC ...
G01R 35/005 (2013.01);
Abstract

A calibration method is configured for calibrating an operation circuit which has a variant offset. The operation circuit includes at least one comparator circuit having a first variant offset. The calibration method provides an adjustable offset to calibrate the variant offset. The method includes: resetting an adjustment parameter to an initial value and configuring the operation circuit to a calibration mode; conducting an initial calibration procedure according to a comparison result of the comparator circuit, to decide an operation calibration code having plural bits; configuring the operation circuit to an operation mode; conducting a predetermined operation procedure according to the operation calibration code, wherein the operation calibration code corresponds to the adjustable offset; conducting a less bit number calibration procedure according to the adjustment parameter and a test calibration code to update the adjustment parameter or the operation calibration code; and repeating the above.


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