The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2024
Filed:
Oct. 09, 2020
Erik Larsson, Halmstad, SE;
Erik Larsson, Halmstad, SE;
Abstract
A system for accessing a plurality of instruments embedded in a semiconductor device includes a hardware interface and a test controller for testing the semiconductor device or generating test patterns for the semiconductor device, wherein the test controller comprises an instrument connectivity language and a procedural description language configuration for operating the instruments. The test controller is configured to perform the steps of: testing at least one functionality of each of the plurality of instruments, thereby receiving a fault status of each of the plurality of instruments; and based on the fault status of the plurality of instruments, configuring a test block in the semiconductor device such that valid test patterns for the semiconductor device can be generated without updating the instrument connectivity language and procedural description language configuration.