The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2024

Filed:

Apr. 14, 2022
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Kaku Irisawa, Ashigarakami-gun, JP;

Yoshihiro Seto, Ashigarakami-gun, JP;

Hitoshi Shimizu, Ashigarakami-gun, JP;

Takahiro Miyato, Ashigarakami-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/543 (2006.01); G01N 21/51 (2006.01); G01N 21/59 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54373 (2013.01); G01N 21/51 (2013.01); G01N 21/59 (2013.01);
Abstract

A test device includes a specimen having a circular cross section that accommodates a test target, a specimen holding part that holds a plurality of the specimens in a row, light emitting elements in which light is incident on two adjacent specimens among the plurality of specimens, a first light guide paththat guides light emitted by the light emitting elements, and a second light guide path that is formed to have a smaller diameter than a diameter of the first light guide path and that guides the light emitted by the light emitting elements from the first light guide path to the specimen.


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