The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2024

Filed:

Apr. 04, 2022
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Xiaoqiang Zhang, Shanghai, CN;

Keke Wang, Shanghai, CN;

Wenjian Sun, Shanghai, CN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/622 (2021.01); H01J 49/00 (2006.01); H01J 49/40 (2006.01);
U.S. Cl.
CPC ...
G01N 27/622 (2013.01); H01J 49/004 (2013.01); H01J 49/40 (2013.01);
Abstract

A high duty cycle ion mobility analysis apparatus includes an ion source, first and second ion storage zones, and an ion mobility analyzer. The ion mobility analyzer includes first and second channels containing a gas flow coaxial with an ion migration direction and a direct current electric field in the opposite direction of the gas flow, and the direct current electric fields in the channels are different in strength. In a continuous scanning period, ions that have not reached appropriate scanning conditions or have missed the appropriate scanning conditions and thus are unable to pass through the mobility analyzer are temporarily stored in two independent ion storage zones without being lost to be analyzed by the mobility analyzer until conditions of the scanning period or a next scanning period are appropriate.


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