The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2024

Filed:

Mar. 04, 2020
Applicant:

Sacmi Cooperativa Meccanici Imola Societa′ Cooperativa, Imola, IT;

Inventor:

Massimo Balducci, Imola, IT;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/90 (2006.01); B65B 29/02 (2006.01); B65B 43/52 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
G01N 21/9081 (2013.01); B65B 29/022 (2017.08); B65B 43/52 (2013.01); G01N 2021/845 (2013.01); G01N 2021/8472 (2013.01);
Abstract

An apparatus () for inspecting an object, where the object is made up of a first layer of plastic material and a second layer of EVO or EVOH and has a base wall (A) and a side wall (B) which is inclined relative to the base wall (A), comprises: an inspection zone () in which the object can be placed for inspection: a conveyor () for feeding the object to the inspection zone () along a feed plane (P): an imaging device () configured to view the object positioned in the inspection zone () and to generate an image () of the object: a processor (), configured to process the image (), to inspect the second layer. The conveyor () is configured to dispose the object in the inspection zone () with the base wall (A) positioned according to a predetermined orientation relative to the feed plane (P).


Find Patent Forward Citations

Loading…