The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2024
Filed:
Dec. 05, 2018
Simon Fraser University, Burnaby, CA;
University of British Columbia, Vancouver, CA;
Ismail M. Khater, Burnaby, CA;
Ghassan Hamarneh, Vancouver, CA;
Ivan Robert Nabi, Vancouver, CA;
Fanrui Meng, Shanghai, CN;
Abstract
A method of super-resolution microscopy is provided. The method includes mapping three-dimensional location of each single emission event in a plurality of single emission events from a series of optical images of a sample to create a point cloud. The point cloud is filtered or refined. Clusters within the point cloud are identified and characterized allowing for an assessment of molecular architecture.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile