The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2024
Filed:
Dec. 05, 2018
Applicants:
Simon Fraser University, Burnaby, CA;
University of British Columbia, Vancouver, CA;
Inventors:
Ismail M. Khater, Burnaby, CA;
Ghassan Hamarneh, Vancouver, CA;
Ivan Robert Nabi, Vancouver, CA;
Fanrui Meng, Shanghai, CN;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G01N 21/64 (2006.01); G01N 33/50 (2006.01); G01N 33/58 (2006.01); G01N 33/68 (2006.01); G02B 21/00 (2006.01); G02B 27/58 (2006.01); G06T 3/4053 (2024.01);
U.S. Cl.
CPC ...
G01N 21/6458 (2013.01); G01N 21/6428 (2013.01); G01N 33/5005 (2013.01); G01N 33/582 (2013.01); G01N 33/6803 (2013.01); G01N 2021/6439 (2013.01); G01N 2201/12 (2013.01);
Abstract
A method of super-resolution microscopy is provided. The method includes mapping three-dimensional location of each single emission event in a plurality of single emission events from a series of optical images of a sample to create a point cloud. The point cloud is filtered or refined. Clusters within the point cloud are identified and characterized allowing for an assessment of molecular architecture.