The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2024
Filed:
Jun. 25, 2020
Sony Group Corporation, Tokyo, JP;
Tetsu Ogawa, Tokyo, JP;
SONY GROUP CORPORATION, Tokyo, JP;
Abstract
There is provided an information processing apparatus including a macro measurement analysis calculation section configured to calculate detection data from a macro measurement section adapted to perform sensing at a first spatial resolution for a first measurement range for a measurement target, a micro measurement analysis calculation section configured to calculate detection data from a micro measurement section adapted to perform sensing at a second spatial resolution for a second measurement range, the second spatial resolution being higher than the first spatial resolution, the second measurement range being included in the first measurement range for the measurement target, and an inverse model calculation section configured to acquire a model parameter used for an inverse model calculation using a calculation result from the macro measurement analysis calculation section, on a basis of the detection data from the micro measurement section determined by the micro measurement analysis calculation section.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile