The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2024
Filed:
Jul. 04, 2019
Nipro Corporation, Osaka, JP;
Sapporo Medical University, Sapporo, JP;
Osamu Honmou, Sapporo, JP;
Daiki Tateyama, Osaka, JP;
Kosuke Takahashi, Osaka, JP;
Kosei Tateyama, Nasushiobara, JP;
Yoshihiro Yoshikawa, Osaka, JP;
NIPRO CORPORATION, Settsu, JP;
SAPPORO MEDICAL UNIVERSITY, Sapporo, JP;
Abstract
An observation device includes a microscope. The microscope includes an illumination light beam source, an illumination optical system, and an observation optical system forming an optical image of an observation target from reflected light beams obtained by reflection of illumination light beams by the observation target. The observation optical system includes a phase plate changing the phase of directly reflected light beams reflected on a reflection surface among the reflected light beams. Both the illumination optical system and the observation optical system are arranged under the observation target. The observation device includes an image pickup device photoelectrically converting the optical image obtained by the observation optical system to create image data of the observation target and a display device displaying the image data. The illumination light beam emitted from the illumination optical system is a collimated light beam.