The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2024

Filed:

Apr. 30, 2019
Applicant:

Hewlett-packard Development Company, L.p., Spring, TX (US);

Inventors:

Enrique Gurdiel Gonzalez, Sant Cugat del Valles, ES;

Manuel Freire Garcia, Sant Cugat del Valles, ES;

Quim Muntal Diaz, Sant Cugat del Valles, ES;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 64/00 (2017.01); B29C 64/393 (2017.01); G01B 11/24 (2006.01); B33Y 10/00 (2015.01); B33Y 50/02 (2015.01);
U.S. Cl.
CPC ...
B29C 64/393 (2017.08); G01B 11/24 (2013.01); B33Y 10/00 (2014.12); B33Y 50/02 (2014.12);
Abstract

In an example, a method may include obtaining a first measurement of a first object generated using additive manufacturing apparatus based on object model data and obtaining a second measurement of a second object generated using the additive manufacturing apparatus based on object model data to which a first geometrical compensation parameter has been applied. An effect of the first geometrical compensation parameter may be determined based on the first and second measurements and, based on the determined effect, the first geometrical compensation parameter may be evaluated.


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