The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2024
Filed:
May. 12, 2021
Applicant:
Konica Minolta, Inc., Tokyo, JP;
Inventors:
Sumiya Nagatsuka, Hino, JP;
Yuki Kawana, Hino, JP;
Assignee:
Konica Minolta, Inc., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2024.01); A61B 6/04 (2006.01); A61B 6/08 (2006.01); A61B 6/46 (2024.01); A61B 6/50 (2024.01); G06T 3/40 (2024.01); G06T 7/62 (2017.01);
U.S. Cl.
CPC ...
A61B 6/48 (2013.01); A61B 6/0492 (2013.01); A61B 6/08 (2013.01); A61B 6/463 (2013.01); A61B 6/505 (2013.01); A61B 6/5264 (2013.01); G06T 3/40 (2013.01); G06T 7/62 (2017.01); A61B 6/0407 (2013.01);
Abstract
A dynamic analysis system processes a dynamic image obtained by irradiation of a subject from a radiation irradiation apparatus and by dynamic imaging on dynamics of the subject detected by a detector. The dynamic analysis system includes a hardware processor that performs position correction of the dynamic image by eliminating an effect of displacement of the subject in a direction perpendicular to a detector plane.