The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2024
Filed:
Apr. 29, 2020
Samsung Electronics Co., Ltd., Suwon-si, KR;
Fasil Abdul Latheef, Bangalore, IN;
Mangesh Abhimanyu Ingale, Bangalore, IN;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
The present disclosure relates to a pre-5-Generation (5G) or 5G communication system to be provided for supporting higher data rates Beyond 4-Generation (4G) communication system such as Long Term Evolution (LTE). Embodiments herein disclose a method for reporting an accessibility measurement by a UE () based on a RRC connection establishment failure in a wireless communication system. The method includes detecting a RRC connection establishment failure and logging parameters selected while attempting the failed RRC connection establishment, wherein the logged parameters are referred as accessibility measurements. Further, the method includes indicating a presence of a connection establishment failure report to a base station () and reporting a connection establishment failure report to the base station (), in response to receiving request from the base station (), wherein the failure report comprises accessibility measurements that comprise at least one of a SSB information selected during cell access and subsequently on which the UE encountered the RRC connection establishment failure and a uplink carrier information selected during cell access and subsequently on which the UE encountered the establishment failure.