The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2024

Filed:

Jan. 21, 2021
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Takahiro Toizumi, Tokyo, JP;

Chisato Funayama, Tokyo, JP;

Masato Tsukada, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/82 (2023.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
H04N 23/82 (2023.01); G06T 7/0002 (2013.01); G06T 2207/10152 (2013.01); G06T 2207/30168 (2013.01);
Abstract

A parameter optimization system () includes: an image sensor () having at least one sensing parameter; a parameter setting unit () configured to be able to change the sensing parameter; a score calculation unit () configured to calculate a score from an image acquired by the image sensor; and a parameter determination unit () configured to determine a right parameter value that is a value of the sensing parameter at which the score is relatively high, based on a value of the sensing parameter and the score corresponding to the value of the sensing parameter. According to such a parameter optimization system, the sensing parameter of the image sensor can be set to an appropriate value.


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