The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2024

Filed:

Feb. 14, 2023
Applicant:

Uif (University Industry Foundation), Yonsei University, Seoul, KR;

Inventors:

Seung Ah Lee, Seoul, KR;

Hye Suk Chae, Seoul, KR;

Yu Jin Lee, Seoul, KR;

Kyung Chul Lee, Yongin-si, KR;

Nak Kyu Baek, Seoul, KR;

Tae Young Kim, Seoul, KR;

Jae Woo Jung, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/55 (2023.01); G03F 1/26 (2012.01); G03F 1/44 (2012.01); G03F 7/00 (2006.01); H04N 23/955 (2023.01);
U.S. Cl.
CPC ...
H04N 23/55 (2023.01); G03F 1/26 (2013.01); G03F 1/44 (2013.01); G03F 7/0017 (2013.01); H04N 23/955 (2023.01);
Abstract

A method for manufacturing a phase mask and a lens-less camera module comprises the steps of: obtaining a replica mold on which an inverted phase shift pattern is formed in which a phase shift pattern of a master phase mask spaced apart from an image sensor is inverted; calculating a thickness of a phase mask disposed on the image sensor replacing the master phase mask; arranging a photocurable material for implementing the phase mask on the image sensor to a calculated thickness, placing the replica mold on an upper surface of the photocurable material, and then curing the photocurable material; and removing the replica mold from the top of the phase mask, so that the focal distance change or parallel movement does not occur depending on the position of the phase mask.


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