The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2024
Filed:
Apr. 05, 2023
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Masato Kobayashi, Chiba, JP;
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/00 (2006.01); G06F 3/12 (2006.01); G06K 15/02 (2006.01); H04N 1/32 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00013 (2013.01); H04N 1/00037 (2013.01); H04N 1/00045 (2013.01); H04N 1/00082 (2013.01); H04N 1/0009 (2013.01); H04N 1/00129 (2013.01);
Abstract
The present invention is related to an inspection apparatus reads a printed material; sets a setting relating to check inspection data for checking data formed on a printed material; derives data defined by a predetermined rule according to setting content set in the setting and generating check inspection data for a plurality of sections in a printed material; and detects a defect in an inspection target printed material by comparing data read in the reading from the inspection target printed material and the corresponding check inspection data generated in the generating.