The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2024

Filed:

May. 14, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Hiroaki Tanaka, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/08 (2006.01); H04B 10/073 (2013.01);
U.S. Cl.
CPC ...
H04B 10/073 (2013.01);
Abstract

In order to detect a terminal station in which a failure has occurred in a WDM optical transmission system that transmits optical signals transmitted thereto from a plurality of terminal stations after performing wavelength multiplexing of said optical signals, this failure detection device includes: an input unit that receives first optical signals from the plurality of terminal stations, the first optical signals having wavelengths respectively allocated to the plurality of terminal stations on the basis of allocation information, and that joins the received first optical signals; a monitoring unit that outputs monitoring signals, which are signals that are in accordance with the intensities corresponding to the respective wavelengths of the joined first optical signals; and an identifying unit that identifies a first terminal station from the plurality of terminal stations on the basis of the allocation information and the monitoring signals.


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