The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2024

Filed:

Aug. 24, 2020
Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Inventor:

Shun Hirao, Kawasaki, JP;

Assignee:

KABUSHIKI KAISHA TOSHIBA, Minato-ku, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01); G01R 31/28 (2006.01); G01R 31/3185 (2006.01); H01L 21/66 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
H01L 22/20 (2013.01); G01R 31/2831 (2013.01); G01R 31/318511 (2013.01); G06F 17/18 (2013.01); G06F 11/008 (2013.01); H01L 22/00 (2013.01);
Abstract

According to an embodiment, an information processing apparatus includes one or more processors. The processors are configured to: generate a plurality of shuffle maps obtained by randomly shuffling, from positions to others, at least some of subject values contained in a subject map having the subject values arrayed in N dimensions (N is an integer of 1 or more); generate a subject vector expressing features of a frequency domain of the subject map and random vectors expressing features of respective frequency domains of the shuffle maps; and derive, as an evaluation value for whether the subject map has a random characteristic, a testing result of statistical hypothesis testing on feature differences between the subject vector and the respective random vectors.


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