The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2024
Filed:
Mar. 12, 2020
Hitachi High-tech Corporation, Tokyo, JP;
Yuka Sumigama, Tokyo, JP;
Yuichiro Hashimoto, Tokyo, JP;
Hiroyuki Yasuda, Tokyo, JP;
Masuyuki Sugiyama, Tokyo, JP;
HITACHI HIGH-TECH CORPORATION, Tokyo, JP;
Abstract
Provided is a technique for accurately determining a performance of a single detector that detects ions having passed through a mass analysis unit. A mass analysis system according to the present disclosure includes, in a mass analysis device, a first converter configured to calculate a first measured value based on an intensity and an area of a pulse in an electric signal output from the detector configured to detect the ions having passed through the mass analysis unit, a second converter configured to obtain a second measured value by counting the number of pulses of the electric signal, a calculation unit configured to calculate an A/P ratio indicating a ratio of the first measured value to the second measured value, a determination unit configured to determine a performance of the detector based on a value of the A/P ratio, and a control unit configured to control at least an output of a determination result obtained by the determination unit.