The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2024
Filed:
Mar. 30, 2020
Shenzhen Hypernano Optics Technology Co., Ltd., Shenzhen, CN;
Min Liu, Shenzhen, CN;
Zhe Ren, Shenzhen, CN;
Xingchao Yu, Shenzhen, CN;
Jinbiao Huang, Shenzhen, CN;
Bin Guo, Shenzhen, CN;
SHENZHEN HYPERNANO OPTICS TECHNOLOGY CO., LTD., Shenzhen, CN;
Abstract
A method for extracting spectral information of a substance under test includes: identifying a pixel region A(x, y) occupied by an object under test from a hyperspectral image acquired; extracting a specular reflection region Aand a diffuse reflection region Afrom the pixel region A(x, y), and calculating a representative spectrum I(ω) of the specular reflection region Aand a representative spectrum I(ω) of the diffuse reflection region A, respectively; by comparing each element in the representative spectrum I(ω) of the specular reflection region Awith each element in the representative spectrum I(ω) of the diffuse reflection region A, separating information of a light source from spectral information of the object to obtain a first spectral invariant C(ω). This method does not require additional spectral information of the light source, which improves the analysis efficiency.