The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2024
Filed:
Dec. 01, 2023
Applicant:
Compound Eye, Inc., Redwood City, CA (US);
Inventors:
Jason Devitt, Redwood City, CA (US);
Haoyang Wang, Redwood City, CA (US);
Harold Wadleigh, Redwood City, CA (US);
Zachary Flom, Redwood City, CA (US);
Assignee:
Compound Eye, Inc., Redwood City, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/80 (2017.01); G06T 1/00 (2006.01); G06T 7/50 (2017.01);
U.S. Cl.
CPC ...
G06T 7/85 (2017.01); G06T 1/0007 (2013.01); G06T 7/50 (2017.01); G06T 2207/10012 (2013.01);
Abstract
A system and/or method for imaging system calibration, including: determining a dense correspondence map matching features in a first image to features in a second image, and determining updated calibration parameters associated with the image acquisition system based on the matching features.