The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2024

Filed:

Jan. 27, 2024
Applicant:

Center for Quantitative Cytometry, San Juan, PR;

Inventors:

Abraham Schwartz, San Juan, PR;

Philip Sherman, Cleveland, OH (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/80 (2017.01); G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
G06T 7/80 (2017.01); G01J 3/2823 (2013.01); G01J 2003/2826 (2013.01); G01J 2003/2879 (2013.01); G06T 2207/10032 (2013.01); G06T 2207/20224 (2013.01);
Abstract

A method to obtain and process data to generate intrinsic hyper-spectral data cubes is provided, where a data acquisition procedure involves scanning the field of view under focused and diffused conditions and an intrinsic calibration procedure requires focused and diffused scans of the field of view of a white reference surface. The spectra of the diffuse scan of the white reference surface is subtracted from the spectra of the focused scan of the white reference surface resulting in a residual data cube of a scan of the white surface. To obtain an intrinsic data cube of a field of view of interest, the residual data cube is added to the diffused data cube of the field of view of interest generating a resulting data cube that is subtracted from the focused data cube field of view of interest.


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